Variant Management for Control Blocks

Piscataway, NJ / IEEE (2015) [Contribution to a book, Contribution to a conference proceedings]

20th IEEE Conference on Emerging Technologies and Factory Automation (ETFA) : September 8 - 11, 2015, Luxembourg / sponsored by the IEEE Industrial Electronics Society ... - 2
Page(s): 1113-1118

Authors

Authors

Wagner, Constantin August
Epple, Ulrich

Identifier