Metamodel-Driven Property Management in Process Industries

Mertens, Martin; Epple, Ulrich

Piscataway, NJ : IEEE (2010)
Contribution to a book, Contribution to a conference proceedings

In: IECON 2010 : 36th annual conference on IEEE Industrial Electronics Society ; Glendale, Arizona, USA, 7 - 10 November 2010 ; [proceedings] / [sponsored by the Institute of Electrical and Electronics Engineers (IEEE); IEEE Industrial Electronics Society (IES)]. - Vol. 2
Page(s)/Article-Nr.: 1341-1346