A Layer-based Approach to Build up Diagnosis Applications in Process Industries

Piscataway, NJ / IEEE (2009) [Contribution to a conference proceedings]

2009 IEEE International Conference on Control and Automation : ICCA 2009 ; Christchurch, New Zealand, 9 - 11 December 2009 / [organizers: IEEE Control Systems Chapter, Singapore ...]
Page(s): 1229-1234

Authors

Selected Authors

Mertens, Martin
Epple, Ulrich

Identifier