A Layer-based Approach to Build up Diagnosis Applications in Process Industries

Mertens, Martin; Epple, Ulrich

Piscataway, NJ : IEEE (2009)
Contribution to a book, Contribution to a conference proceedings

In: 2009 IEEE International Conference on Control and Automation : ICCA 2009 ; Christchurch, New Zealand, 9 - 11 December 2009 / [organizers: IEEE Control Systems Chapter, Singapore ...]
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